Details

ISBN/EAN: 978-3-659-48905-1
Einband: kartoniertes Buch
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Auflage:
1. Auflage 2013
Erschienen am:
Sprache:
English
Umfang:
100 S.
Format (T/L/B):
0.7 x 22 x 15 cm

Hersteller:
OmniScriptum SRL
info@omniscriptum.com
Str. Armeneasca 28/1, office 1
MD 2012 Chisinau


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Study on Yield Related Traits in Wheat

Estimation of HeritabIlity and Genetic Advance for Yield and Yield Related Traits in Bread Wheat

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Beschreibung

Need for the improvement in wheat yield is increasing continuously due to day by day increase in human population on the same land. This challenge is much greater in the developing countries than the developed world. Many breeding programs are based on selection of desirable parents for hybridization thats the main source to create genetic variation which is heritable to offspring. This study was carried out to have information on the magnitude of heritability and genetic advance of various important wheat parameters as it plays an important role for planning breeding strategy. For this purpose second filial (F2) generation of ten cross combinations involving seven wheat varieties/genotypes were studied. These were planted in field in a Randomized Complete Block Design with three replications. At maturity 200 plants from each cross and 20 plants from each parent were taken and data were recorded. The information derived will be very helpful to make improvement in wheat yield through reliable selection as it is suggested that varieties/genotypes showing good results should be given due importance in future breeding programs.

Über Obaidullah Khan

I am a Research Scientist working in the field of Plant Breeding & Genetics at Ayub Agricultural Research Institute , Faisalabad, Pakistan. I worked as Research Associate in NIAB, Faisalabad, Pakistan almost for one year. I have done M.Sc. (Hons.) degree in Plant Breeding & Genetics from University of Agriculture, Faisalabad, Pakistan in 2011.